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Author * Vikas Chandra, Robert Aitken (ARM, U.S.A.) Page: pp. 707 - 712: Keyword: Reliability, Gate oxide degradation, SRAM, Vmin: Abstract: Low voltage operation of SRAM arrays is critical in ...
On the Impact of Gate Oxide Degradation on SRAM Dynamic and Static Write-ability: Author * Vikas Chandra, Robert Aitken (ARM, U.S.A.) Page: pp. 707 - 712
... 688 7240 alanw@ieee.org Technical Program Chair: Conference Chair: Rakesh Kumar University of Illinois Urbana IL USA rakeshk@uiuc.edu Publication Chair: Treasurer: Vikas Chandra Vikas.Chandra ...
... floor at South City I, in March 2007, at a monthly rental of Rs 10,000 and just after seven months, my landlord asked to raise the monthly rental to Rs 12,000," Vikas Chandra ...
Sachin Idgunji, Vikas Chandra, Cezary Pietrzyk, Imran Iqbal, Rob Aitken, and Greg Yeric, ARM Inc., USA: We present a test chip architecture which embeds a thorough set of process ...
Author * Vikas Chandra, Robert Aitken (ARM, U.S.A.) Page: pp. 707 - 712: Keyword: Reliability, Gate oxide degradation, SRAM, Vmin: Abstract: Low voltage operation of SRAM arrays is ...
On the Impact of Gate Oxide Degradation on SRAM Dynamic and Static Write-ability: Author * Vikas Chandra, Robert Aitken (ARM, U.S.A.) Page: pp. 707 - 712
R ESUME C ONFERENCE P UBLICATIONS : 2011 [C48] Hong Luo, Xiaoming Chen*, Jyothi Velamala*, Yu Wang , Yu Cao, Vikas Chandra, Yuchun Ma and Huazhong Yang, "Circuit-level delay ...
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