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1673-1676: New Scheme of Electrostatic Discharge Circuit Simulations Using Protection Device Model with Generated-Hole-Dependent Base Resistance
Soodoo Chae, Changju Lee, Juhyung Kim, Sukkang Sung, Jaeseong Sim, Moonkyung Kim, Sewook Yoon, Younseok Jeong, Wonil Ryu, Taehun Kim, Byung-Gook Park, Jo-won Lee and Chungwoo Kim
1673-1676: New Scheme of Electrostatic Discharge Circuit Simulations Using Protection Device Model with Generated-Hole-Dependent Base Resistance
Soodoo Chae, Changju Lee, Juhyung Kim, Sukkang Sung, Jaeseong Sim, Moonkyung Kim, Sewook Yoon, Younseok Jeong, Wonil Ryu, Taehun Kim, Byung-Gook Park, Jo-won Lee and ...
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