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CONSIGNEE_2008_C1: Ocean Bill of Lading Samples - U.S. Customs Imports Data - Ealing Trade Navigator
... vacancy-type and interstitial-type defects in Ge ion implanted silicon, R. Kögler ... grown on quartz and diamond substrates, P. Achatz, O. A. Williams, P. Bruno, D ...
Professional tagging database for defects in semiconductors ... 1. Appl. Phys. Express 3, 051002 (2010) , Nitrogen Related Electron Trap with High Capture Cross ...
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