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Xi, Z. C. Xia, Hui-Rong, Xia, jiding Xia, Qijun, Xia, Xiang-Gen. Xiao, Lizhi Xiao, Wenjiao Xiao, Yang Xicart, Joseph. Xie, Heping Xie, Lin, Xie, Lin. Xie, M. Xie, M. Xie, Yu, Xin, Qin.
Gate-Induced Drain Leakage Current Enhanced by Plasma Charging Damage Siguang Ma, Yaohui Zhang, M. F. Li, We idan Li, Joseph Xie, GeorgeT. T. Sheng, Andrew C. Yen, and John L. F. Wang ...
L Cha, EF Chor, H Gong, AQ Zhang, L Chan, and Joseph Xie, "Evaluation of the dielectric breakdown of reoxidized nitride oxide (ONO) in flash memory devices using constant ...
Joseph Xie, Tin Hau . I do believe that this may be one of the stupidest letters I've seen in the SCMP. To deal with what is at most a very small problem, we should destroy everything ...
Joseph Xie Ph.D. (Rensselaer Polytechnic Ins.), M.S. (Rensselaer Polytechnic Ins.), M.S. (Rensselaer Polytechnic Ins.), B.Sc. (Jiao Tong) Ultra-thin gate dielectrics.
... follow-up IC Frontier Academic Forum, Prof. Ryuji Kohno from Yokohama University, Prof. Zhiping Yu and Prof. Zhihua Wang from Tsinghua University, Dr. Joseph Xie ...
Dr. Joseph Xie Zhifeng: R&D Manager, Deep Submicron Integrated Circuit-Process Integration
Xi, Z. C. Xia, Hui-Rong, Xia, jiding Xia, Qijun, Xia, Xiang-Gen. Xiao, Lizhi Xiao, Wenjiao Xiao, Yang Xicart, Joseph. Xie, Heping Xie, Lin, Xie, Lin. Xie, M. Xie, M. Xie, Yu, ...
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Singapore MIT Alliance (Educational Institution; 501-1000 employees; Semiconductors industry): Professor/Fellow, (1998-2001)
Chartered Semiconduct...