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: Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development / by Way Kuo, Wei-Ting Kary Chien, Taeho Kim
100 10 Chi, Ch'ao-ting, $d 1903- Record n 80042369 . 100 10 O, Yang-ho. Record n 80046352 . 100 10 Liu, Ta-chung, $d 1914-1975 . Record n 80113757
1E: Kary Yip (7B) 2A: Pensi Lam (5A) 2B: Raymond Tse Ka Wai (5A) 2C: Katherine Yu (5C ... 3C: Iris Chiu Yuen Ting (6B) 3D: Cheng Yu Lo Karen (6C) 3E: Simon Ko (6C)
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