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Nobuya Oka, Chia Yee Ooi, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara," Test Generation and DFT based on Partial Thru Testability," Trans. of IEICE on ...
Policy Concerning "Relationship with Suppliers" Our Policy "Relationship with Suppliers" Nobuya Oka General Manager General Purchasing Dept. Pharmaceutical Production Div. Katsuyoshi ...
Nobuya Oka, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) Partially thru testable sequential circuits are known to be practically testable, and a condition ...
Kohsuke Morinaga, Nobuya Oka, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) The class of acyclic sequential circuits is $\tau^2$-bounded, i.e., acyclic ...
Nobuya Oka, Chia Yee Ooi, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara," Test Generation and DFT Based on Partial Thru Testability," 2009 IEEE European Test ...
... fault modeling, RTL ATPG & Relationship between RTL and gate level testing Chair: S5-1 A New Class of Acyclically Testable Sequential Circuits with Multiplexers Nobuya Oka ...
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Takeda Pharmaceuticals (Pharmaceuticals indu...
Takeda Pharmaceuticals Company Limited (Pharmaceuticals industry): General Manager, General Purchasing D...