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Tong-Yi Zhang, L.Q. Chen and Ran Fu, Measurements of Residual Stresses in Thin Films Deposited on Silicon Wafers by Indentation Fracture, Acta Materialia, 47 (1999) 3869 ...
Room 402, 205 Block, Che Gone Miao Industrial Park (Tai Ran), Fu Tian Section, Shenzhen City, GuangDong Province, China: Tel: +86-0755-83420192: Fax:
Lilin Liu, Haiyou Huang, Ran Fu, Deming Liu, Tong-Yi Zhang, Cu diffusion kinetics in (Cu,Ni)3Sn intermetallic compound nanolayers investigated by an energy-dispersive-X-ray-based ...
ni yi ran fu chi dang wo wu zhu de shi hou wo de sheng ming jiao tuo ni wu lun kai xin shi yi, dou shen xin ni jiang hui pei ban wo zhi dao yong yuan
Tong-Yi Zhang, Long-Qing Chen, and Ran Fu, Measurements of Residual Stresses in Thin Films Deposited on Silicon Wafers by Indentation Fracture, Acta Mater., Vol. 47(1999) 3869-3878
Tong-Yi Zhang, L.Q. Chen and Ran Fu, Measurements of Residual Stresses in Thin Films Deposited on Silicon Wafers by Indentation Fracture, Acta Materialia, 47 ...
Room 402, 205 Block, Che Gone Miao Industrial Park (Tai Ran), Fu Tian Section, Shenzhen City, GuangDong Province, China: Tel: +86-0755-83420192: Fax:
REN Da peng, ZHOU Jue shen, CHEN Xi yao, NI Ran fu, XIANG Shi kai (China Academy of Engineering Physics, Mianyang 621900, China); TEM Study of Tritium Effect in ...
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