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Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume: 1432-1437: Yongjoon Kim, Jaeseok Park and Sungho Kang
Jin-Ho Ahn, and Sungho Kang, ETRI Journal, vol.28, no.4, Aug. 2006, pp.475-485. DOI:10.4218/etrij.06.0105.0254 Quadrature Oscillators with Grounded Capacitors ...
Dynamic Power Supply Current Testing for Open Defects in CMOS SRAMs Doe-Hyun Yoon , Hong-Sik Kim , and Sungho Kang , ETRI Journal, vol.23, no.2, June 2001 ...
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