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Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) Soft errors in logic circuits due to the ...
Taiki Uemura KanTakeuchi Toshikazu Fukuda Shigetaka Kumashiro: Measurement of Neutron-induced Single Event Transient Pulse Width Narrower than 100ps
Taiki Uemura, Yoshiharu Tosaka and Shigeo Satoh. Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan (Received September 6, 2005; accepted January 5, 2006 ...
Yoshiharu Tosaka, Ryozo Takasu, Hiedo Ehara 1, Taiki Uemura, Hideki Oka, Shigeo Satoh, Nobuyuki Matsuoka 2 and Kichiji Hatanaka 2. Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno ...
Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) Soft errors in logic circuits due to the ...
Taiki Uemura, Yoshiharu Tosaka and Shigeo Satoh. Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan (Received September 6, 2005; accepted January 5 ...
Taiki Uemura KanTakeuchi Toshikazu Fukuda Shigetaka Kumashiro: Measurement of Neutron-induced Single Event Transient Pulse Width Narrower than 100ps
Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, and Shigeo Satoh. Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan (Received October 1, 2007; accepted ...
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