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APEX/JJAP PAPER AWARD. Thickness Dependence of Ferroelectricity in Heteroepitaxial BaTiO 3 Thin Film Capacitors Naoko Yanase, Kazuhide Abe, Noburu Fukushima, and Takashi Kawakubo
... Scanners for Molecular Imaging Taiga YAMAYAand Hideo MURAYAMA Tutorial Trend on Digital Forensics Ryoichi SASAKI MEMS Variable Capacitor Having Piezoelectric Actuator Takashi KAWAKUBO ...
5369-5373: Epitaxial Growth of BaTiO 3 Thin Films by High Gas Pressure Sputtering: Takaaki Yasumoto, Naoko Yanase, Kazuhide Abe and Takashi Kawakubo
Takashi Kawakubo, Shuichi Komatsu, Kazuhide Abe, Kenya Sano, Naoko Yanase and Noburu Fukushima. Materials and Devices Research Labs., R&D Center, Toshiba Corporation, 1 Komukai ...
... Corporate R&D Center, Toshiba Corporation, noburu.fukushima@toshiba.co.jp) Non-member Takashi KAWAKUBO (Corporate R&D Center, Toshiba Corporation, takashi.kawakubo@toshiba.co.jp) ...
Thickness Dependence of Ferroelectricity in Heteroepitaxial BaTiO 3 Thin Film Capacitors Naoko Yanase, Kazuhide Abe, Noburu Fukushima, and Takashi Kawakubo
5369-5373: Epitaxial Growth of BaTiO 3 Thin Films by High Gas Pressure Sputtering: Takaaki Yasumoto, Naoko Yanase, Kazuhide Abe and Takashi Kawakubo
Takashi Kawakubo, Shuichi Komatsu, Kazuhide Abe, Kenya Sano, Naoko Yanase and Noburu Fukushima. Materials and Devices Research Labs., R&D Center, Toshiba Corporation ...
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Toshiba Corporation (Public Company; Electrical/Electronic Manufacturing industry): Chief Reserch Engineer, (April 1982-March 2003) Research and develop...