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Tsuguo KOHNO and Shoichi TANAKA. Tokyo Metropolitan Institute of Technology, 6-6 Asahigaoka, Hino, Tokyo, 191 Japan (Accepted August 4, 1994) A new type of Hartmann test was developed ...
Tsuguo KOHNO Luminescence and Impurities in Semicoductors Shigeko SHIONOYA Channeling Effects and Lattice Defects Michihiko MANNAMI, Takashi OSHIYAMA and Hiroshi KUDO
Develop various derivative models Implement models into trading and risk management ... Contact Tsuguo Kohno Tel: +81 3 5403 7023 Email: tkohno@morganmckinley.co.jp
Tsuguo KOHNO, Shoichi TANAKA : 121: Particle Sizing by Planar-Phase Doppler System: Yoshihisa AIZU, Hiroyuki WASHIYAMA, Hiromichi MISHINA : 125: Absolute Positioning of Scanning Probe ...
Figure Measurement of Concave Mirror by Fiber-Grating Hartmann Test: Tsuguo KOHNO and Shoichi TANAKA: Release Date: March 28, 2000 [Image PDF (197K)]
Tsuguo KOHNO and Shoichi TANAKA. Tokyo Metropolitan Institute of Technology, 6-6 Asahigaoka, Hino, Tokyo, 191 Japan (Accepted August 4, 1994) A new type of Hartmann test was ...
Tsuguo KOHNO Luminescence and Impurities in Semicoductors Shigeko SHIONOYA Channeling Effects and Lattice Defects Michihiko MANNAMI, Takashi OSHIYAMA and Hiroshi KUDO
Develop various derivative models Implement models into trading and risk ... Contact Tsuguo Kohno Tel: +81 3 5403 7023 Email: tkohno@morganmckinley.co.jp
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