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... Modeling of Dynamic Threshold Voltage in High K Gate Stack and the Application in FinFET Reliability - Chenyue Ma, Bo Li, Lining Zhang, Jin He, Xing Zhang, Xinnan Lin, Yu ...
... of Dynamic Threshold Voltage in High K Gate Stack and the Application in FinFET Reliability (68) - Chenyue Ma, Bo Li, Lining Zhang, Jin He, Xing Zhang, Xinnan Lin, Yu Cao ...
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