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Grown-in Defects in Heavily Boron-Doped Czochralski Silicon: Xuegong Yu, Xiangyang Ma, Chunlong Li, Jiansong Yang and Deren Yang: Release Date: 20070903
Xuegong Yu, Xiangyang Ma, Chunlong Li, Jiansong Yang and Deren Yang Published July 7 ... Schottky Barrier Height Determination by Capacitance-Voltage Measurement on ...
Xuegong Yu, Xiangyang Ma, Chunlong Li, Jiansong Yang and Deren Yang. State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027, People's Republic of China
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