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Third row, from left: Eishi Ibe, Hisao Kameda, Hiromi Ueda, Akihiko Kasukawa, Fumio Koyama Second row, from left: Kazuo Hagimoto, Kenji Anami, Takeshi Inoue, Kaoru Yano, Yutaka Yasuda
Eishi Ibe : Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicond... ICD2008-10
Eishi Ibe: Hitachi: For contributions to neutron-induced soft-error analysis for semiconductor memory devices: 6: Tokyo: Takeshi Inoue: NEC: For contributions to bulk wave piezoelectric devices ...
by Takashi Nakamura (Tohoku University, Japan), Mamoru Baba (Tohoku University, Japan), Eishi Ibe (Hitachi Ltd., Japan), Yasuo Yahagi (Hitachi Ltd., Japan), & Hideaki Kameyama ...
Eishi IBE, Yasuo YAHAGI, Fumio KATAOKA, Akira ETO, Mitsumori HIDAKA, Yoshikazu SAITO and Hideaki KAMEYAMA Our Research Wideband wavelength tunable ultrashort pulse generation ...
Eishi IBE, Yasuo YAHAGI, Fumio KATAOKA, Akira ETO, Mitsumori HIDAKA, Yoshikazu SAITO and Hideaki KAMEYAMA Our Research Wideband wavelength tunable ultrashort pulse ...
... ac.jp RF & Analog, Mixed signal Didier Belot [email protected] Andrea Mazzanti [email protected] SoC/MPSoC/SIP Dac Pham [email protected] Soft Error Rate Eishi Ibe ...
Eishi Ibe, Moriaki Tsukamoto and Shigeru Izumi 453-459 : Magnetic and Electrical Properties in Amorphous Ge-Se-Fe, Ge-Fe and Se-Fe Films Ichiro Watanabe, Masataka Kawauchi ...
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