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Muhammad Suhaimi Sulong, Ibrahim Ahmad, Lim Teck Foo, and Yeap Kim Ho, "Characterization of a 130 nm CMOS Device Using CVIV and Focused Ion Beam", Journal of Science and ...
NM LABORATORY SDN. BHD. *..,"U-'' 30, LORONG PEFDA SELATAN 1, AANDAF PADA, 14OOO BUXIT ... SP805/0753 Test perfomed by : Ms. Ashley Hoo Ms Tan Hooi Cheng Certified By: Yeap Cheo ...
Fully depleted silicon-on-insulator (FD SOI) devices with 70 nm gate lengths for ... Pelella, P. Yeh, G. Burbach, B. Taylor, Y. Jeon, W. J. Qi, R. Li, J. Conner, G. Yeap ...
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