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Jih Wen Chou, Chun Yun Chang, Lien Tse Ho, Joe Ko 1 and Peter Hsue 1. National Nano Device Laboratory and Institute of Electronics National Chiao-Tung University, Hsinchu, Taiwan ...
... Implanted Drain Structure: Surface Counter-Doped-Lightly Doped Drain for High Hot Carrier Reliability: Jih Wen Chou, Chun Yun Chang, Chimoon Huang, Lien Tse Ho, Joe Ko and Peter Hsue
Jih Wen Chou, Chun Yun Chang, Lien Tse Ho, Joe Ko 1 and Peter Hsue 1. National Nano Device Laboratory and Institute of Electronics National Chiao-Tung University, Hsinchu ...
... Drain Structure: Surface Counter-Doped-Lightly Doped Drain for High Hot Carrier Reliability: Jih Wen Chou, Chun Yun Chang, Chimoon Huang, Lien Tse Ho, Joe Ko and Peter Hsue
Ming-Dou Ker, Chung-Yu Wu, Chung-Yuan Lee, Joe Ko, and Peter Hsue, "An on-chip ESD protection circuit with complementary SCR structures ...
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