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Abstract: An angle compensation method compensates for the angle of the light-receiving surface of a photodiode disposed in an inclination detection device.
"Compensating of crosstalk in the optical lever deflection method used in atomic force microscope"Satoru FUJISAWA and Hisato OGISO, Review of Scientific Instruments, vol. 74, pp.5115 ...
Mechanical Property Measurement of Thin Films & Coatings under VAMAS-twa22 project----- List of Publications (Click here) -----
Background and Aim: Electrostatic force due to electrification ... Satoru Fujisawa & YujiEnomoto
Satoru FUJISAWA: Research Projects Displacement Sensor, Optical-Lever-Deflection Method, Nano-Tribology, Limitation of Displacement Sensing
Abstract: An angle compensation method compensates for the angle of the light-receiving surface of a photodiode disposed in an inclination detection device.
"Compensating of crosstalk in the optical lever deflection method used in atomic force microscope"Satoru FUJISAWA and Hisato OGISO, Review of Scientific Instruments, vol. ...
Background and Aim: Electrostatic force due to electrification seriously influences microtribology such as the operation of micro machine. This is because electrostatic ...
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