People Search
Phones, Emails, Addresses, Background check, Web references
All public info
Like other search engines (Google or Bing) Radaris collects information from public sources.
Shinji Yokogawa (NEC Electronics) (3)Cu-drift induced electric leakage during TDDB test in damascene Cu interconnect Young-Chang Joo (Seoul ...
Shinji Yokogawa and Hideaki Tsuchiya. Advanced Device Development Division, NEC Electronics Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
... Special Session (Reliability) Speakers 1) Paul Ho (University of Texas) 2) Shinji Yokogawa (NEC Electronics) 3) Young-Chang Joo (Seoul University） ...
Noriaki Oda, Shinya Ito, Toshiyuki Takewaki, Kazutoshi Shiba, Hiroyuki Kunishima, Nobuo Hironaga, Ichiro Honma, Hiroaki Nanba, Shinji Yokogawa, Akiko Kameyama, Takayuki ...
Electromigration-Induced Void Growth Kinetics in SiN x-Passivated Single-Damascene Cu Lines: Shinji Yokogawa: Release Date: 20070903 ...
Shinji Yokogawa and Hideaki Tsuchiya. Advanced Device Development Division, NEC Electronics Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
Noriaki Oda, Shinya Ito, Toshiyuki Takewaki, Kazutoshi Shiba, Hiroyuki Kunishima, Nobuo Hironaga, Ichiro Honma, Hiroaki Nanba, Shinji Yokogawa, Akiko Kameyama, ...
Yumi Kakuhara 1,2, Shinji Yokogawa 1, and Kazuyoshi Ueno 2. 1 Advanced Device Development Division, NEC Electronics Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229 ...
Linkedin